Elements of X-RAY Difraction
Detalles de publicación: 1957Descripción: 514 páginasISBN:- fcnm2380
- 515.6I/C95
Contenidos:
1.Precise parametric measurements. 2.Phase-Diagram determination. 3.Order-disorver diformations. 4.Chemical analysis by diffraction. 5.Chemical analysis by fluorescence. 6.Chemical analysis by absortion. 7.Stress measurement. 8.Suggestions for further study.
| Tipo de ítem | Biblioteca actual | Signatura topográfica | Estado | Notas | Código de barras | |
|---|---|---|---|---|---|---|
| Libro | Biblioteca Especializada FCNM Tercer Piso | 515.6I/C95 (Navegar estantería(Abre debajo)) | Disponible | Interno | FCNM3829 |
Navegando Biblioteca Especializada FCNM estanterías, Ubicación en estantería: Tercer Piso Cerrar el navegador de estanterías (Oculta el navegador de estanterías)
| 515.6I/B38 Introduction to Matrix Analysis | 515.6I/B59 Calculus : A Modeling Approach | 515.6I/B84 The Lefschetz Fixed Point Theorem | 515.6I/C95 Elements of X-RAY Difraction | 515.6I/L64 Functional Analysis | 515.6I/M28 Numerical Methods Using Matlab | 515.6I/M86 (S.C) Stable intersections of regular cantor sets with large hausdorff dimension |
1.Precise parametric measurements. 2.Phase-Diagram determination. 3.Order-disorver diformations. 4.Chemical analysis by diffraction. 5.Chemical analysis by fluorescence. 6.Chemical analysis by absortion. 7.Stress measurement. 8.Suggestions for further study.
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