00725nam a2200169Ia 450000500170000000800410001702000130005808200150007110000190008624500330010526000090013830000180014750502630016594200080042899900170043695201020045320241211205647.0241211s1957    xx            000 0 und d  afcnm2380  a515.6I/C95  aCullity, B. D. 0aElements of X-RAY Difraction  c1957  a514 páginas  a1.Precise parametric measurements. 2.Phase-Diagram determination. 3.Order-disorver diformations. 4.Chemical analysis by diffraction. 5.Chemical analysis by fluorescence. 6.Chemical analysis by absortion. 7.Stress measurement. 8.Suggestions for further study.  yLIB  c51601d51601  00104070aBE-FCNMbBE-FCNMcTPd2018-08-13eDonacionfBuenoo515.6I/C95pFCNM3829yLIBzInterno