Elements of X-RAY DIFFRACTION
Detalles de publicación: United State of América : Addison-Wesley Publishing Company, 1956Descripción: 137 páginasISBN:- fcnm2518
- 537.535I/C95
Contenidos:
1.Properties of X-RAYS. 2.The geometry of crystals. 3.Diffraction I: The directions of diffracted beams. 4.Diffraction II: The intensities of diffracted beams. 5.Laue photographs. 6.Power photographs. 7.Diffractometer measurements. 8.Orientations of single crystals. 9.The structure of polycrystalline aggregates. 10.The determination of crystal structure. 11.Precise parameter measurements. 12.Phase-Diagram determination. 13.Order-Disorder transformation. 14.Chemical-Analysis by Diffraction. 15. Chemical-Analysis by fluorescence. 16.Chemical Analysis by absorption. 17.Stress measurement. 18.Suggestions for further study.
| Tipo de ítem | Biblioteca actual | Signatura topográfica | Estado | Notas | Código de barras | |
|---|---|---|---|---|---|---|
| Libro | Biblioteca Especializada FCNM Tercer Piso | 537.535I/C95 (Navegar estantería(Abre debajo)) | Disponible | Interno | FCNM3965 |
1.Properties of X-RAYS. 2.The geometry of crystals. 3.Diffraction I: The directions of diffracted beams. 4.Diffraction II: The intensities of diffracted beams. 5.Laue photographs. 6.Power photographs. 7.Diffractometer measurements. 8.Orientations of single crystals. 9.The structure of polycrystalline aggregates. 10.The determination of crystal structure. 11.Precise parameter measurements. 12.Phase-Diagram determination. 13.Order-Disorder transformation. 14.Chemical-Analysis by Diffraction. 15. Chemical-Analysis by fluorescence. 16.Chemical Analysis by absorption. 17.Stress measurement. 18.Suggestions for further study.
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