000 00610nam a2200157Ia 4500
005 20241211205647.0
008 241211s1957 xx 000 0 und d
020 _afcnm2380
082 _a515.6I/C95
100 _aCullity, B. D.
245 0 _aElements of X-RAY Difraction
260 _c1957
300 _a514 páginas
505 _a1.Precise parametric measurements. 2.Phase-Diagram determination. 3.Order-disorver diformations. 4.Chemical analysis by diffraction. 5.Chemical analysis by fluorescence. 6.Chemical analysis by absortion. 7.Stress measurement. 8.Suggestions for further study.
942 _yLIB
999 _c51601
_d51601