| 000 | 01045nam a2200157Ia 4500 | ||
|---|---|---|---|
| 005 | 20241211205649.0 | ||
| 008 | 241211s1956 xx 000 0 und d | ||
| 020 | _afcnm2518 | ||
| 082 | _a537.535I/C95 | ||
| 100 | _aCullity, B. D. | ||
| 245 | 0 | _aElements of X-RAY DIFFRACTION | |
| 260 |
_aUnited State of América : _bAddison-Wesley Publishing Company, _c1956 |
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| 300 | _a137 páginas | ||
| 505 | _a1.Properties of X-RAYS. 2.The geometry of crystals. 3.Diffraction I: The directions of diffracted beams. 4.Diffraction II: The intensities of diffracted beams. 5.Laue photographs. 6.Power photographs. 7.Diffractometer measurements. 8.Orientations of single crystals. 9.The structure of polycrystalline aggregates. 10.The determination of crystal structure. 11.Precise parameter measurements. 12.Phase-Diagram determination. 13.Order-Disorder transformation. 14.Chemical-Analysis by Diffraction. 15. Chemical-Analysis by fluorescence. 16.Chemical Analysis by absorption. 17.Stress measurement. 18.Suggestions for further study. | ||
| 942 | _yLIB | ||
| 999 |
_c51739 _d51739 |
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